Work

Special Issue on the 7th International Sino MOS ‐ AK Workshop

Year: 2025

Type: editorial

Source: International Journal of Numerical Modelling Electronic Networks Devices and Fields

DOI: 10.1002/jnm.70114

Authors: Jun Zhang, Wladek Grabinski, Yuehang Xu

Institutions: Nanjing University of Posts and Telecommunications, Institute of Electron Technology, University of Electronic Science and Technology of China

Language: English

Open Access status: bronze

OpenAlex ID: W4414075008

Cites: 4

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Related to: 10