A Fast MMC Loss Assessment Method and Application for the ThéVenin's Equivalent Electromagnetic Transient Model
Year: 2025
Type: conference-paper
Authors: Feng Su, Jun Li, Fengfeng Li, Jinwei Lv, Lv Cui, Xingxing Zhou, Jin Zhou
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414117646
