CHART: Intelligent Sensing-Based Fault Diagnosis Method for EV Charging Infrastructure
Year: 2025
Type: article
Source: IEEE Sensors Journal
Authors: Hongyan Dui, Jiabao Zhai, Xinghui Dong, Mengbo Zhai
Institution: Zhengzhou University
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G1880644616
OpenAlex ID: W4414165950
