AAAD: Adaptive Activated Anomaly Detection on Varied Backgrounds
Year: 2025
Type: conference-paper
Authors: Ken Miyamoto, Teng-Yok Lee, Akira Minezawa
Institution: Mitsubishi Electric (Japan)
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414169696