Work

Sliced Vision Transformers for Fine-Grained Anomaly Detection and Localization

Year: 2025

Type: conference-paper

DOI: 10.1109/avss65446.2025.11149919

Authors: Nasar Iqbal, Mattia Zanier, Marco Vernier, Christian Micheloni, Niki Martinel

Institution: University of Udine

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414169776

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Cites: 19

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