Work

A PCB SMD Solder Quality Inspection Method Based on Dual-Path Region Segmentation and Color Clustering

Year: 2025

Type: conference-paper

Source: Conference on Fully Actuated System Theory and Applications (FASTA)

DOI: 10.1109/fasta65681.2025.11138582

Authors: Yang Cheng, JinYong Yu, WeiHua Liu

Institutions: Harbin Institute of Technology, Yongjiang Laboratory

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Zhejiang Province

Awards: 面向混合键合对准工艺中的超高精度晶圆视觉检测方法研究, G6108543026

OpenAlex ID: W4414169937

FWCI:

Cites: 14

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