Work

Subpixel Measurement Method for Surface Mount Devices Based on Edge Tracing

Year: 2025

Type: conference-paper

Source: Conference on Fully Actuated System Theory and Applications (FASTA)

DOI: 10.1109/fasta65681.2025.11138239

Authors: Weihua Liu, Yipeng Liu, Chungang Han

Institutions: Yongjiang Laboratory, Harbin Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Research and Development Program of Zhejiang Province

Awards: G3683347169, G8009372892

OpenAlex ID: W4414170667

FWCI: 2.526

Cites: 12

Cited by: 1

Related to: