High performance vertically integrated double barrier AlN memristive nonvolatile resistive random-access memory
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0267634
Authors: Xian-Qin Liu, Haijiao Harsan Ma, Siwen Zhang, Yueying Zhang, Yan Cao, Lei Wang, Hao-Nan Li, Yi-Xing He, Jiang Zhu, Yue-Qi Wang, Shengrui Xu, Chunping Jiang, Yue Hao, Jincheng Zhang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G4325260170, G7336771713, G8897782944
OpenAlex ID: W4414188272
