The anticipated redox reaction induced by the nickel oxide transport layer with perovskite in perovskite-based light-emitting diodes
Year: 2025
Type: conference-abstract
DOI: 10.1117/12.3064432
Authors: Tzung-Fang Guo, Thi Hoai Do, Hsin-Yu Lin
Institutions: Academia Sinica, National Cheng Kung University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414193370
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