Development of an Intrinsically Safe Circuit Arc Simulation Platform and Characterization of Arc Discharge
Year: 2025
Type: conference-paper
Authors: Hui Zhang, Huiling Jiang, Guangkun Tang, Zhongwei Zhang, Anhu Wang, Wei Fang, Zixiao Hao, Changqing Gao
Institution: University of Science and Technology Beijing
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414198345
