(Un-)sharpening deflectometry simulations by camera aperture ray tracing
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3064380
Authors: Simon Hartel, Christian Faber
Institution: University of Applied Sciences Landshut
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414224784
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