Refining optical testing accuracy through advanced on-axis deflectometry
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3066000
Authors: Byeongjoon Jeong, Heejoo Choi
Institution: University of Arizona
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414224790