Two-wavelength dynamic interferometer for measuring roughness
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3064633
Authors: Kevin Curtis, Erick Ruiz
Institution: 4D Technology (United States)
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414228105
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