Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications
Year: 2025
Type: article
Authors: Sandeep Kumar, Atin Mukherjee
Institution: National Institute of Technology Rourkela
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G7120645278
OpenAlex ID: W4414229155