Adaptive Transfer Learning With Deformable Convolution for Wafer Defect Pattern Recognition
Year: 2025
Type: article
Authors: Jia-Hong Chou, Fu-Kwun Wang, Hsuan-Kai Chen
Institution: National Taiwan University of Science and Technology
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414229581