Band Alignment at Interface of ZnO/Si Heterojunction Investigated by X‐Ray Photoelectron Spectroscopy
Year: 2025
Type: article
Source: Surface and Interface Analysis
DOI: 10.1002/sia.70020
Institution: Pingdingshan University
Language: English
Topic: ZnO doping and properties
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Award: G391905257
OpenAlex ID: W4414255032
