Identification of mm-scale defects in composite insulators by terahertz imaging technology and an improved YOLOv11 model
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.569990
Authors: Yonggang Zhang, Suwei Zhou, Xiuwei Yang, Lanju Liang, Xin Yan, Haiyun Yao, Zhenhua Li, Ziqun Wang, Xiaofei Hu, Yulin He, Fan Yang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414266128
