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Identification of mm-scale defects in composite insulators by terahertz imaging technology and an improved YOLOv11 model

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Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.569990
Authors: Yonggang Zhang, Suwei Zhou, Xiuwei Yang, Lanju Liang, Xin Yan, Haiyun Yao, Zhenhua Li, Ziqun Wang, Xiaofei Hu, Yulin He, Fan Yang
Institutions: Qilu University of Technology, Shandong Academy of Sciences, Zaozhuang University
Language: English

Topic: Terahertz technology and applications
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Shandong Province, State Key Laboratory of Millimeter Waves
Awards: G2140751471, G3070835090, G3286055975, G3317971151, G3481904789, G431642641, G6481839024
OpenAlex ID: W4414266128
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Cites: 37
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