Work

Unsupervised Industrial Products Anomaly Detection Via Adaptive Complementary Channels and Complete Span Enhancement

Year: 2025

Type: article

Source: Journal of Circuits Systems and Computers

DOI: 10.1142/s021812662550450x

Authors: Long Li, Zhiyan Han, Jian Wang

Institution: Bohai University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Liaoning Province

Awards: G50846620, G6790860268, G6811234340

OpenAlex ID: W4414269643

FWCI:

Cites: 38

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