Demonstration of enhanced lateral resolution in Fizeau interferometry using a tilted binary pseudo-random array test sample
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3065738
Institution: Lawrence Berkeley National Laboratory
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414315014
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