Towards defect-free lithography: study of process instabilities for efficient lithography-based patterning
Year: 2025
Type: conference-abstract
DOI: 10.1117/12.3065921
Authors: Sanshrey Keshri, Manjarik Mrinal, Shubham Meena, Tapajyoti D. Gupta
Institution: Indian Institute of Science Bangalore
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414321335
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