Work

Advancing particle contamination monitoring in space applications: automated optical microscopy as an alternative approach

Year: 2025

Type: conference-paper

DOI: 10.1117/12.3065766

Authors: Guido Kreck, Udo Gommel, Yvonne Holzapfel, Christian Rudschewski

Institution: Fraunhofer Institute for Manufacturing Engineering and Automation

Language: English

Topic: Space Technology and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414326065

FWCI:

Cites:

Cited by:

Related to: