Dual-chain error modeling and sensitivity analysis of a thin-walled deep-hole internal thread grinder
Year: 2025
Type: conference-abstract
DOI: 10.1117/12.3076273
Authors: Hui Xiao, Yongsheng Zhao, Xiaoqing Tan, Yang Li, Jianhui Wang, Heng Gao
Institution: Beijing University of Technology
Language: English
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414346499
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