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YOLOv10-SCI: single-chip microcomputer defect detection based on the improved YOLOv10 network

Year: 2025

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3077547

Authors: Yuandong Xiao, Renyu Sun, Kai Shi, Chenfeng Yuan, Mengyuan Yi, Aojie Song, Yingyu Liu, Jiahao Chen, Jiale Xiang, Lei Ye

Institutions: Wuhan Donghu University, Hubei Business College

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414349910

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