Work

Lightweight temporal residual modeling for event-based image deblurring

Year: 2025

Type: conference-paper

Source: International Conference on Machine Vision, Automatic Identification, and Detection (MVAID)

DOI: 10.1117/12.3077478

Authors: Shu Xu, Wenyan Wei

Institution: Wuhan Donghu University

Language: English

Topic: Advanced Image Processing Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414350158

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