Year: 2025
Type: conference-paper
Abstract: The Zn2TiO4 films were deposited on MgAl2O4 substrates via pulsed laser deposition. Afterwards, post-annealing process was used to improve the crystallization quality of the films. The structural characteristics, surface morphology, and epitaxial mechanism of the films before and after annealing were analysed in detail. The results of XRD and HRTEM determined the high-quality epitaxial crystallization characteristics of the annealed film, and the epitaxial growth relationships were Zn2TiO4 (400)//MgAl2O4 (400) and Zn2TiO4 [010]//MgAl2O4 [010].
DOI: 10.1117/12.3085353
Authors: Biao Zhang, Hongyan Zhu, Caina Luan, Jin Ma, Hongdi Xiao
Institution: Shandong University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
OpenAlex ID: W4414357808
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