Work

Performance-Oriented Analytical Modelling of Channel Engineered-Macaroni Induced Gate All Around Field Effect Transistor for Off-State Leakage Mitigation

Year: 2025

Type: article

Source: ECS Journal of Solid State Science and Technology

DOI: 10.1149/2162-8777/ae09d8

Authors: Aapurva Kaul, Sonam Rewari, Deva Nand

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414396366

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Cites: 33

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