Work

Reference-Plane-Invariant and Unique Permittivity Determination of Thin Samples Positioned on a Substrate Using One-Port Waveguide Measurements

Year: 2025

Type: article

Source: IEEE Transactions on Microwave Theory and Techniques

DOI: 10.1109/tmtt.2025.3608627

Authors: Ugur Cem Hasar, Huseyin Korkmaz

Institution: Gaziantep University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414404953

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Cites: 64

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