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YOLO-DSE: PCB surface defect detection with the improved YOLO

Year: 2025

Type: conference-paper

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1109/isaeece66033.2025.11159692

Authors: Jinyu Chen, Wenjia Liu

Institution: Guangdong University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414405139

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Cites: 14

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