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Design-Technology Co-Optimization and Statistical Process Variation Analysis of Complementary GAAFETs-Based Full Adder Circuits

Year: 2025

Type: conference-paper

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1109/isaeece66033.2025.11159902

Author: Yunjie Li

Institution: South China University of Technology

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414405178

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Cites: 20

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