Work

CHC-DETR: An End-to-End Efficient Defect Detection Network

Year: 2025

Type: conference-paper

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1109/isaeece66033.2025.11160252

Authors: Zihan Hu, Chuanlin Zhang, Jun Hu, Zhongyang Fan, Jinze Li, Liangmiao Jin

Institution: Shanghai University of Electric Power

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414405324

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Cites: 6

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