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Optimising Microwave Darkroom Layout to Enhance Test Accuracy Using Reinforcement Learning

Year: 2025

Type: conference-paper

Source: International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE)

DOI: 10.1109/isaeece66033.2025.11160132

Author: Da Chu

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414405360

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Cites: 10

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