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Defect Detection in Electronics Manufacturing via Deep Learning-Based Visual Inspection

Year: 2025

Type: conference-paper

DOI: 10.1109/icctdc64446.2025.11159033

Authors: T. Srihari, A. Murugesan, Neeraj Kumar, T Eswaran, T. V. Hyma Lakshmi, K.T. Shivaram

Institutions: Saveetha University, SRKR Engineering College, Dayananda Sagar College of Engineering

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414405906

FWCI: 32.84

Cites: 13

Cited by: 13

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