Immunity test and failure analysis of tunneling magnetoresistance current sensor
Year: 2025
Type: conference-paper
Authors: Guanying Wang, Xianfeng Liang, Genghui Deng, Yansong Zhang, Meizhen Xiao
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414405967
