A Mini-Review on Mitigating Degradation of Metallic Interconnects in Solid Oxide Cell Stack Systems: Advances, Challenges, and Solutions
Year: 2025
Type: review
Source: Energy & Fuels
Authors: Yuankang Hao, Rui Zhu, Hongwei Cao, Zuoqing Liu, Ran Ran, Guangming Yang
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Awards: G3958257135, G6507745616, G6592886312
OpenAlex ID: W4414408308
