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Digital Twins in Reliability Engineering: Innovations, Challenges and Opportunities

Year: 2025

Type: article

Source: The ITEA Journal of Test and Evaluation

DOI: 10.61278/itea.46.3.1005

Authors: David Han, James D. Brownlow

Institutions: The University of Texas at San Antonio, Edwards Air Force Base, U.S. Air Force Test Center

Language: English

Topic: Digital Transformation in Industry

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414412695

FWCI: 0.519

Cites:

Cited by: 1

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