Work

Defect-induced subgap state engineering in neuromorphic metal-oxide phototransistors for in-sensor color processing

Year: 2025

Type: article

Source: Materials Horizons

DOI: 10.1039/d5mh01018g

Authors: Eun Chong Ju, Dong Hwan Byeon, Jong Min Lee, Yu-Jung Cha, Hyung Gon Shin, Seongil Im, Jeong-Wan Jo, Yong-Hoon Kim, Sung Kyu Park, Sung Woon Cho

Institutions: Chung-Ang University, Sunchon National University, Yonsei University, University of Cambridge, Sungkyunkwan University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Trade, Industry and Energy, National Research Foundation of Korea

Awards: G2148140542, G4519993503, G8088737703

OpenAlex ID: W4414429034

FWCI: 0.226

Cites: 29

Cited by: 1

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