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MOSFET Reliability Using Machine Learning

Year: 2025

Type: conference-paper

Source: IEEE Wireless Antenna and Microwave Symposium (WAMS)

DOI: 10.1109/wams64402.2025.11158141

Authors: Khilawan Choudhary, Manpuran Mahto, S K Datta

Institutions: Microwave Tube Research & Development Centre, National Institute of Technology Patna

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4414432118

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