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Forecasting Wafer Fab Outputs using Lot Remaining Cycle Time Prediction in Semiconductor Manufacturing

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Year: 2025
Type: conference-paper
Source: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)
DOI: 10.1109/case58245.2025.11164128
Authors: Adrien Wartelle, Stéphane Dauzère-Pérès, Claude Yugma, Quentin Christ, Renaud Roussel
Institutions: Centre National de la Recherche Scientifique, Université Clermont Auvergne, STMicroelectronics (France)
Language: English

Topic: Forecasting Techniques and Applications
Subfield: Management Science and Operations Research
Field: Decision Sciences
Domain: Social Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W4414432465
FWCI:
Cites: 5
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