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Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach

Year: 2025

Type: conference-paper

Source: 2022 IEEE 18th International Conference on Automation Science and Engineering (CASE)

DOI: 10.1109/case58245.2025.11163813

Authors: Beom-Seok Kim, Jin-Su Shin, Dong-Hee Lee

Institutions: Sungkyunkwan University, Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414432829

FWCI: 2.526

Cites: 14

Cited by: 1

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