Work

Shallow Convolutional Neural Network for Defect Classification in Composite Materials Using Terahertz Images

Year: 2025

Type: conference-paper

Source: IEEE Wireless Antenna and Microwave Symposium (WAMS)

DOI: 10.1109/wams64402.2025.11158343

Authors: A. Mercy Latha, S. Tanuja, Ram Likhith, Rishi Ranjan, S. Vinson Joshua

Institutions: Central Electronics Engineering Research Institute, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Central Electronics Engineering Research Institute

Award: G1377726996

OpenAlex ID: W4414433047

FWCI: 2.526

Cites: 15

Cited by: 1

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