Work

Rapid, versatile, and reliable metrology for multi-layer transition metal dichalcogenide thin films using atomic force microscopy to investigate surface grain distributions

Year: 2025

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0276152

Authors: A. Tonon, A. Gupta, E. Di Russo, B. Sheehan, P. Metaxa, A. Arifutzzaman, J. Connolly, J. Lin, I. Povey, F. Sgarbossa, D. De Salvador, E. Napolitani, R. Duffy

Institutions: University of Padua, University College Cork, Tyndall National Institute, Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali di Legnaro

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Irish Research Council, Università degli Studi di Padova, Ministero dell'Università e della Ricerca, H2020 Research Infrastructures, NextGenerationEU

Awards: G2229603242, G2260330509, Access to European Infrastructure for Nanoelectronics

OpenAlex ID: W4414436477

FWCI: 0.208

Cites: 27

Cited by: 1

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