Dose-efficient cryo-electron microscopy for thick samples using tilt- corrected scanning transmission electron microscopy
Year: 2025
Type: article
Abstract: Cryogenic electron microscopy is a powerful tool in structural biology. In thick specimens, challenges arise as an exponentially larger fraction of the transmitted electrons lose energy from inelastic scattering and can no longer be properly focused as a result of chromatic aberrations in the post-specimen optics. Rather than filtering out the inelastic scattering at the price of reducing potential signal, as is done in energy-filtered transmission electron microscopy, we show how a dose-efficient and unfiltered image can be rapidly obtained using tilt-corrected bright-field scanning transmission electron microscopy data collected on a pixelated detector. Enhanced contrast and a 3-5× improvement in dose efficiency are observed for two-dimensional images of intact bacterial cells and large organelles using tilt-corrected bright-field scanning transmission electron microscopy compared to energy-filtered transmission electron microscopy for thicknesses beyond 500 nm. As a proof of concept for the technique's performance in structural determination, we present a single-particle analysis map at sub-nanometer resolution for a highly symmetric virus-like particle determined from 789 particles.
Source: Nature Methods
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: hybrid
Estimated APC paid: $12,690
Awards: G1205195086, G1321126357, Center for Bright Beams, G1586064656, MRI: Acquisition of a Cryogenic, Aberration-Corrected Scanning Transmission Electron Microscope for Advanced Materials Research and Education, G2414013413, G2415270547, Cornell Center for Materials Research - MRSEC, G4303070870, G5917061246, G6351810044, CAREER: Analytical Cryo-Scanning Transmission Electron Microscopy for Understanding Physical and Chemical Processes at Liquid/Solid Interfaces, G7767248047, MIP: Platform for the Accelerated Realization, Analysis, and Discovery of Interface Materials (PARADIM)
OpenAlex ID: W4414448343
