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Impact of Fine-Tuned Embeddings on Machine Learning-Based Causal Detection

Year: 2025

Type: conference-paper

Source: International Conference on Intelligent Technologies (CONIT)

DOI: 10.1109/conit65521.2025.11167597

Authors: C M Rohith, K B Sivachandra, Neethu Mohan, S Sachin Kumar

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Topic Modeling

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414459146

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