Work

Performance Analysis of the Fine-Tuned YOLOv8n Model for Detection and Classification of Printed Circuit Boards Defects

Year: 2025

Type: conference-paper

DOI: 10.1109/isci65687.2025.11167605

Authors: Laura-Nicoleta Ivanciu, Mihai-Sorin Mihai-Sorin Mihuţ

Institution: Technical University of Cluj-Napoca

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414464631

FWCI:

Cites: 10

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