Characterization of diffraction efficiency for X-ray analyzer crystals using a laboratory-based primary diffraction photon method
Year: 2025
Type: article
Source: Applied Optics
DOI: 10.1364/ao.575231
Authors: Yue Li, Renzhou Zheng, Pengfei Qiang, Yongqing Yan, Lizhi Sheng
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414465266
