Year: 2025
Type: conference-paper
Abstract: We present a comprehensive characterization of commercial CMOS sensors using complementary measurement techniques. We focus on obtaining the Photon Transfer Curve, Dark Current, and Read Noise as key performance parameters. The Photon Transfer Curve was derived to evaluate the sensor’s dynamic range and linearity. This was accomplished using two different methods:the conventional approach, based on homogeneous images, and a novel complementary method, which relies on repeated samples of the same inhomogeneous image. Additionally, we studied the temperature dependence of dark current, taking into account the effect of an infrared filter, and the readout noise was determined as low as 2 electron per pixel. This work establishes the technical foundation for characterizing and operating CMOS sensors, serving as a starting point for a series of undergraduate experiments. Nevertheless, it also offers valuable insights into the operational limits and potential scientific applications of commercial CMOS sensors.
DOI: 10.22323/1.501.1239
Authors: Ana Martina Botti, Lara Sofía Barreiro, Sabrina Benas, Carla Bonifazi, Florencia Cammarata, Mora Danussi, Eliana Depaoli, Pilar López Maggi, Julieta Pérez Lanzillotta, Dario Rodrigues, Georg Schulze, Javier Tiffenberg
Institution: Universidad de Buenos Aires
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W4414492948
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