Operational thermal limit stress analysis of LED device under highly accelerated degradation testing
Year: 2025
Type: conference-paper
DOI: 10.1117/12.3082150
Authors: Jiayu Huang, Xuan Su, Qiqin Wei, Guolin Lin, Jianshu Lu, Miao Cai
Institution: Guilin University of Electronic Technology
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414494531
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