EMI-Related Common-Mode Noise Analysis of CMOS and CML Drivers
Year: 2025
Type: conference-paper
Authors: Guangyu Sheng, Hanzhi Ma, Zhanxi Pang, Jianquan Lou, Haiwen Lu, Alpesh Bhobe, Er-Ping Li
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414499834