Self-Supervised Learning for Few-Shot Industrial Defect Detection
Year: 2025
Type: conference-paper
Authors: Yiyan Chen, Jialing Tang, Chenxin Zeng
Institutions: Beijing Institute of Technology, Guangdong Peizheng College
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4414500054