Work

Radiated Susceptibility Testing Using Near-Field Scanning

Year: 2025

Type: conference-paper

DOI: 10.1109/emcsipi52291.2025.11170296

Authors: McKennan Starkey, Aaron Harmon, Cody Goins, Kristen Donnell, Victor Khilkevich, Daryl Beetner

Institution: Missouri University of Science and Technology

Language: English

Topic: Electromagnetic Compatibility and Measurements

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4414500101

FWCI:

Cites: 14

Cited by:

Related to: